Nanoscale piezoresponse of 70-nm poly(vinylidene fluoride-trifluoroethylene) films annealed at different temperatures.
In order to characterize the piezoelectric properties of 70 nm thick poly(vinylidene fluoride-trifluoroethylene), P(VDF-TrFE), films grown by a spin-coating technique, both nanoscale manipulation and polarization switching were studied using piezoresponse force microscopy (PFM). We varied the annealing temperature from 75 C to 145 C and achieved a high-quality 70 nm P(VDF-TrFE) film annealed at the temperature of 95 C. Ferroelectric domains and their properties were confirmed using X-ray diffraction, grazing incidence reflection absorption Fourier Transform Infrared (GIRA-FTIR) and PFM analysis. The ferroelectric domains in the film were homogeneously switchable below 5 V with a remnant d{sub 33} of 14.9 pm/V. This offers our rationale for a promise in energy harvesting and switchability would be good for plastic electronics.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); MEST - Korea; KOSF grant
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 979887
- Report Number(s):
- ANL/MSD/JA-66273; TRN: US201011%%342
- Journal Information:
- Phys. Status Solid RRL, Vol. 4, Issue 3-4 ; Mar. 2010; ISSN 1862-6254
- Country of Publication:
- United States
- Language:
- ENGLISH
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