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INTERFACIAL POLARIZATION AND DIELECTRIC PROPERTIES IN BIFEO3 FILMS: NEURAL NETWORK ANALYSIS OF STEM-EELS DATA

Conference ·
OSTI ID:979230
 [1];  [1];  [1];  [2];  [3];  [1];  [4];  [1]
  1. ORNL
  2. University of Twente, Enschede, Netherlands
  3. National Chiao Tung University, Hsinchu, Taiwan
  4. University of California, Berkeley
+ Show Author Affiliations

No abstract prepared.

Research Organization:
Oak Ridge National Laboratory (ORNL); Shared Research Equipment Collaborative Research Center
Sponsoring Organization:
ORNL LDRD Seed-Money; ORNL LDRD Director's R&D; SC USDOE - Office of Science (SC)
DOE Contract Number:
AC05-00OR22725
OSTI ID:
979230
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
BISMUTH OXIDES
DATA ANALYSIS
DIELECTRIC PROPERTIES
ENERGY-LOSS SPECTROSCOPY
INTERFACES
IRON OXIDES
NEURAL NETWORKS
POLARIZATION
SCANNING ELECTRON MICROSCOPY
TRANSMISSION ELECTRON MICROSCOPY