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Title: Tailoring the magnetization reversal of elliptical dots using exchange bias.

Journal Article · · J. Appl. Phys.
DOI:https://doi.org/10.1063/1.2840467· OSTI ID:975435

Exchange bias effects have been studied in elliptical dots composed of ferromagnetic Ni{sub 80}Fe{sub 20}-antiferromagnetic Ir{sub 20}Mn{sub 80} bilayers. The magnetization reversal mechanisms and magnetic configurations have been investigated by magneto-optic Kerr effect and magnetic force microscopy. Although the obtained bias fields in these dots are relatively small, the magnetization reversal is found to be influenced by the ferromagnetic-antiferromagnetic coupling. Namely, for some off-axis angles of measurement, the magnetization reversal mechanism of the Ni{sub 80}Fe{sub 20}-Ir{sub 20}Mn{sub 80} ellipses depends on whether exchange bias is induced along the minor or major axis of the ellipses. Hence, exchange bias is shown to be an effective means for tailoring the magnetization reversal of elliptical dots after sample fabrication.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC); ESF
DOE Contract Number:
DE-AC02-06CH11357
OSTI ID:
975435
Report Number(s):
ANL/CNM/JA-61100; JAPIAU; TRN: US201008%%275
Journal Information:
J. Appl. Phys., Vol. 103, Issue 2008; ISSN 0021-8979
Country of Publication:
United States
Language:
ENGLISH