Comparative study on the growth of silver nanoplates on GaAs substrates by electron microscopy, synchrotron x-ray diffraction and optical spectroscopy.

Journal Article · Tue Jan 01 04:00:00 EST 2008 · J. Phys. Chem. C

DOI:https://doi.org/10.1021/jp801647k· OSTI ID:973019

Sun, Y; Yan, H; Wiederrecht, G; BNL,

We have recently developed a simple and efficient approach involving the galvanic reaction between a pure aqueous solution of AgNO{sub 3} and GaAs wafers to directly grow high-quality Ag nanoplates with chemical clean surfaces on the GaAs wafers [Chem. Mater. 2007, 19, 5845; Small 2007, 3, 1964]. The capability to finely control the dimensions (i.e., size and thickness) of the Ag nanoplates and the time-dependent characterizations have not been explored yet. In this article, time-dependent evolutions of the Ag nanostructures grown on highly doped n-type GaAs wafers through the reactions with AgNO{sub 3} solutions, which have concentrations varying in the range of 1-10 M, for different times have been systematically investigated by employing various powerful techniques including electron microscopy, synchrotron X-ray diffraction, and optical microscopy. The results indicate that the sizes of Ag nanoplates can be tuned in the range from tens of nanometers to half a micrometer and their thicknesses can be varied from -20 to -160 nm by simultaneously controlling the concentration of AgNO{sub 3} solution and the growth time. The as-grown Ag nanoplates exhibit tunable strong extinction peaks in the ultraviolet-visible-near-infrared spectral regimes, where the GaAs substrates intensively interact with the light.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 973019
• Report Number(s): ANL/CHM/JA-61098
• Journal Information: J. Phys. Chem. C, Journal Name: J. Phys. Chem. C Journal Issue: 2008 Vol. 112; ISSN 1932-7447
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
AQUEOUS SOLUTIONS
DIMENSIONS
ELECTRON MICROSCOPY
NANOSTRUCTURES
OPTICAL MICROSCOPY
SILVER
SPECTROSCOPY
SUBSTRATES
SYNCHROTRONS
THICKNESS
X-RAY DIFFRACTION