Combined Apertureless Near-Field Optical Seconde-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection
- ORNL
- University of Georgia, Athens, GA
A dual atomic force/near-field scanning optical microscope (AFM/NSOM) with an 800-nm ultrafast laser excitation source was used to investigate apertureless, tip-enhanced second harmonic generation (SHG) of ZnO nanowires. Data from far-field single-particle SHG microscopy images and spectra show little to no contributions from band-gap or other emission. The SHG microscope image and the simultaneous tapping mode AFM and apertureless SHG NSOM images indicate that ZnO nanowires exhibit a strong SHG signal consistent with uniform crystallinity, whereas other ZnO particles found with the wires had a variable, weaker SHG signal. Polarization data established values for Chi(33)/Chi(31) close to previous estimates. Our AFM/SHG NSOM data suggest a particle degradation mechanism under atmospheric conditions starting at the endpoints of the nanowire.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 970469
- Journal Information:
- Nano Letters, Journal Name: Nano Letters Journal Issue: 1 Vol. 64
- Country of Publication:
- United States
- Language:
- English
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