A method to improve spectral resolution in planar semiconductor gamma-ray detectors
Conference
·
OSTI ID:96961
- International Technology Hanford Company, Richland, WA (United States)
- Westinghouse Hanford Co., Richland, WA (United States)
This paper describes an empirically derived algorithm to compensate for charge trapping in CdTe, CdZnTe, and other planar semiconductor detectors. The method is demonstrated to be an improvement over available systems and application to experimental data is shown.
- Research Organization:
- Westinghouse Hanford Co., Richland, WA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC06-87RL10930
- OSTI ID:
- 96961
- Report Number(s):
- WHC-SA--2861; CONF-951073--6; ON: DE95011635
- Country of Publication:
- United States
- Language:
- English
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