skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: The Influence of Anisotropic Strain on the Dielectric and Ferroelectric Properties of SrTiO3 Thin Films on DyScO3 Substrates

Journal Article · · Physical Review B
 [1];  [2];  [2];  [2];  [3];  [3];  [2];  [4];  [5];  [1]
  1. ORNL
  2. Pennsylvania State University
  3. Pennsylvania State University, University Park, PA
  4. Institute for Crystal Growth, Berlin, Germany
  5. Argonne National Laboratory (ANL)

The in-plane dielectric and ferroelectric properties of coherent anisotropically strained SrTiO{sub 3} thin films grown on orthorhombic (101) DyScO{sub 3} substrates were examined as a function of the angle between the applied electric field and the principal directions of the substrate. The dielectric permittivity revealed two distinct maxima as a function of temperature along the [100]{sub p} and [010]{sub p} SrTiO{sub 3} pseudocubic directions. These data, in conjunction with optical second-harmonic generation, show that the switchable ferroelectric polarization develops first predominantly along the in-plane axis with the larger tensile strain before developing a polarization component along the perpendicular direction with smaller strain as well, leading to domain twinning at the lower temperature. Finally, weak signatures in the dielectric and second-harmonic generation response were detected at the SrTiO{sub 3} tilt transition close to 165 K. These studies indicate that anisotropic biaxial strain can lead to new ferroelectric domain reorientation transitions that are not observed in isotropically strained films.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC05-00OR22725
OSTI ID:
967112
Journal Information:
Physical Review B, Vol. 79, Issue 22; ISSN 1098-0121
Country of Publication:
United States
Language:
English