Beam Effects During AES and XPS Analysis
Book
·
OSTI ID:965633
It is important to realize that any surface analysis method may alter the specimen in some way. Alterations that complicate the ability to collect the desired information are usually considered damage. Damage (like beauty) is in the eye of the beholder. In some cases, analysis-induced changes to a sample will have little or no impact on the information sought. In other cases, similar changes will be totally unacceptable and considered information-destroying damage. The analyst must therefore be able to recognize damage in all its various forms, understand its origins, and be able to compensate for, or limit, its effects on the analysis.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (US)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 965633
- Report Number(s):
- PNNL-SA-38633; KC0303020
- Country of Publication:
- United States
- Language:
- English
Similar Records
Outline of a failure: a true story of nine precepts, with two morals
EYE STRAIN AND EYE PROTECTION DURING IRRADIATION THERAPY AND DIAGNOSIS
Use and Limitations of Electron Flood Gun Control of Surface Potential During XPS: Two Non-homogeneous Sample Types
Conference
·
Thu Aug 01 00:00:00 EDT 1985
·
OSTI ID:6439675
EYE STRAIN AND EYE PROTECTION DURING IRRADIATION THERAPY AND DIAGNOSIS
Journal Article
·
Tue Oct 01 00:00:00 EDT 1963
· Radiographica
·
OSTI ID:4078117
Use and Limitations of Electron Flood Gun Control of Surface Potential During XPS: Two Non-homogeneous Sample Types
Journal Article
·
Tue Oct 01 00:00:00 EDT 2002
· Surface and Interface Analysis, 33:781-790
·
OSTI ID:15001737