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Title: Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy

Abstract

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180{sup o} domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

Authors:
 [1];  [1];  [1];  [2];  [2]
  1. ORNL
  2. National Academy of Science of Ukraine, Kiev, Ukraine
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
965287
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 90; Journal Issue: 21
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; FERROELECTRIC MATERIALS; MICROSCOPY; RESOLUTION; PARAMETRIC ANALYSIS

Citation Formats

Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., and Morozovska, A. N. Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy. United States: N. p., 2007. Web.
Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., & Morozovska, A. N. Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy. United States.
Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., and Morozovska, A. N. Mon . "Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy". United States. doi:.
@article{osti_965287,
title = {Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy},
author = {Jesse, Stephen and Kalinin, Sergei V and Rodriguez, Brian J and Eliseev, E. A. and Morozovska, A. N.},
abstractNote = {One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180{sup o} domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.},
doi = {},
journal = {Applied Physics Letters},
number = 21,
volume = 90,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}
  • One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180 degree domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.
  • Piezoresponse force microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data, including measurements of the intrinsic width of the domain walls, determination of geometric parameters of the domain below the tip in local hysteresis loop measurements, as well as interpretation of local switching and coercive biases in terms of material properties and switching mechanisms, requires reliable knowledge on electrostatic and strain field structures produced by the tip. Using linear imaging theory, we develop a theoretical approach for the interpretation of these measurements and the determination ofmore » tip parameters from a suitable calibration standard. The resolution and object transfer functions in PFM are derived, and the effect of material parameters on resolution is determined. Closed-form solutions for domain-wall profiles in vertical and lateral PFM and signals from cylindrical and nested cylindrical domains in transversally isotropic piezoelectric are derived for point-charge and sphere-plane geometries of the tip.« less
  • Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on the micro- and nanoscale. However, reliability of PFM signals is often problematic and their quantification is challenging and thus not widely applied. Here, we present a study of the reproducibility of PFM signals and of the so-called PFM background signal which has been reported in the literature. We find that PFM signals are generally reproducible to certain extents. The PFM signal difference between 180° domains on periodically poled lithium niobate (PPLN) is taken as the reference signal in a large number of measurements, carried out in a lowmore » frequency regime (30-70 kHz). We show that in comparison to Pt coated tips, diamond coated tips exhibit improved signal stability, lower background signal, and less imaging artifacts related to PFM which is reflected in the spread of measurements. This is attributed to the improved mechanical stability of the conductive layer. The average deviation of the mean PFM signal is 38.3%, for a diamond coated tip. Although this deviation is relatively high, it is far better than values from the literature which showed a deviation of approx. 73.1%. Additionally, we find that the average deviation of the background signal from 0 is 11.6% of the PPLN domain contrast. Thus, the background signal needs to be taken into account when quantifying PFM signals and should be subtracted from PFM signals. Those results are important for quantification of PFM signals, since PPLN might be used for this purpose when PFM signals measured on PPLN are related to its macroscopic d{sub 33} coefficient. Finally, the crucial influence of sample polishing on PFM signals is shown and we recommend to use a multistep polishing route with a final step involving 200 nm sized colloidal silica particles.« less
  • Here, the monoclinic (M) phases in high-performance relaxor-based ferroelectric single crystals have been recognized to be a vital structural factor for the outstanding piezoelectric property. However, due to the complexity of the structure in M phases, the understanding about it is still limited. In this paper, the local twin domains and tip-voltage-induced domain switching of the M C phase in Pb(Mg 1/3Nb 2/3)O 3 - 0.34PbTiO 3 (PMN-0.34PT) single crystal have been intensively investigated by piezoresponse force microscopy (PFM). By theoretically analyzing the experimental patterns of domain walls on the (001) C face, the specific M C twin domains inmore » the initial annealed state of a selected area have been clarified, and the polarization orientation of the M C phase in this sample is determined to be at an angle of 29 degrees to the < 001 > C directions. In addition, based on the evolution of domains and the motion of domain walls under the step-increased PFM tip dc voltage (V dc), the switching process and features of different types of M C domain variants are visually revealed« less