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Title: Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy

Abstract

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180{sup o} domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

Authors:
 [1];  [1];  [1];  [2];  [2]
  1. ORNL
  2. National Academy of Science of Ukraine, Kiev, Ukraine
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
965287
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 90; Journal Issue: 21
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; FERROELECTRIC MATERIALS; MICROSCOPY; RESOLUTION; PARAMETRIC ANALYSIS

Citation Formats

Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., and Morozovska, A. N. Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy. United States: N. p., 2007. Web.
Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., & Morozovska, A. N. Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy. United States.
Jesse, Stephen, Kalinin, Sergei V, Rodriguez, Brian J, Eliseev, E. A., and Morozovska, A. N. Mon . "Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy". United States. doi:.
@article{osti_965287,
title = {Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy},
author = {Jesse, Stephen and Kalinin, Sergei V and Rodriguez, Brian J and Eliseev, E. A. and Morozovska, A. N.},
abstractNote = {One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180{sup o} domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.},
doi = {},
journal = {Applied Physics Letters},
number = 21,
volume = 90,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}