Quantitative Determination of Tip Parameters in Piezoresponse Force Microscopy

Journal Article · Sun Dec 31 23:00:00 EST 2006 · Applied Physics Letters

OSTI ID:965287

Jesse, Stephen ^[1]; Kalinin, Sergei V ^[1]; Rodriguez, Brian J ^[1]; Eliseev, E. A. ^[2]; Morozovska, A. N. ^[2]

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1. ORNL
2. National Academy of Science of Ukraine, Kiev, Ukraine

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180{sup o} domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 965287
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 90; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
FERROELECTRIC MATERIALS
MICROSCOPY
PARAMETRIC ANALYSIS
RESOLUTION