X-Ray and Neutron Diffraction Measurements of Dislocation Density and Subgrain Size in a Friction-Stir-Welded Aluminum Alloy
- ORNL
- Eotvos University, Budapest, Hungary
- Los Alamos National Laboratory (LANL)
The dislocation density and subgrain size were determined in the base material and friction-stir welds of 6061-T6 aluminum alloy. High-resolution X-ray diffraction measurement was performed in the base material. The result of the line profile analysis of the X-ray diffraction peak shows that the dislocation density is about 4.5 x 10{sup 14} m{sup -2} and the subgrain size is about 200 nm. Meanwhile, neutron diffraction measurements have been performed to observe the diffraction peaks during friction-stir welding (FSW). The deep penetration capability of the neutron enables us to measure the peaks from the midplane of the Al plate underneath the tool shoulder of the friction-stir welds. The peak broadening analysis result using the Williamson-Hall method shows the dislocation density of about 3.2 x 10{sup 15} m{sup -2} and subgrain size of about 160 nm. The significant increase of the dislocation density is likely due to the severe plastic deformation during FSW. This study provides an insight into understanding the transient behavior of the microstructure under severe thermomechanical deformation.
- Research Organization:
- Oak Ridge National Laboratory (ORNL); Shared Research Equipment Collaborative Research Center
- Sponsoring Organization:
- ORNL LDRD Director's R&D
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 964717
- Journal Information:
- Metallurgical and Materials Transactions A, Journal Name: Metallurgical and Materials Transactions A Journal Issue: 5 Vol. 41A; ISSN 1073-5623
- Country of Publication:
- United States
- Language:
- English
Similar Records
In-situ Time-Resolved Neutron Diffraction Measurements of Microstructure Variations during Friction Stir Welding in a 6061-T6 Aluminum Alloy
Grain structure and dislocation density measurements in a friction stir welded aluminum alloy using x-ray peak profile analysis