Effect of Interfacial Resistance on AC Loss as a Function of Applied AC Field in YBCO Filamentary Conductors

Journal Article · Thu Jan 01 04:00:00 EST 2009 · IEEE Transactions on Applied Superconductivity

DOI:https://doi.org/10.1109/TASC.2009.2018455· OSTI ID:963678

Duckworth, Robert C ^[1]; List, III, Frederick Alyious ^[1]; Zhang, Yifei ^[1]

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1. ORNL

To reduce ac loss in Y-Ba-Cu-O (YBCO) coated conductors while maintaining current sharing between filaments, an attempt was made to introduce an interfacial resistance between the YBCO filaments and a continuous silver cap layer. The YBCO filaments were produced via laser scribing of MOCVD YBCO films deposited on standard Ion Beam Assisted Deposition (IBAD) templates. After laser scribing, the filaments were exposed to air at room temperature to degrade the YBCO surface. A three micron thick silver cap layer was then and each sample was oxygen annealed at different temperature to produce different interface resistance at the interface between the silver and YBCO. Measurements of the ac loss was measured as a function of applied perpendicular field and frequency revealed a correlation between the reduction in coupling loss and the oxygen annealing temperature.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: OE USDOE - Office of Electric Transmission and Distribution
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 963678
• Journal Information: IEEE Transactions on Applied Superconductivity, Journal Name: IEEE Transactions on Applied Superconductivity Journal Issue: 3 Vol. 19
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALTERNATING CURRENT
BARIUM OXIDES
CHEMICAL VAPOR DEPOSITION
COATINGS
COPPER OXIDES
ENERGY LOSSES
FILAMENTS
INTERFACES
SILVER
YBCO coated conductors
YTTRIUM OXIDES
ac loss
conductor stability
continuous stabilization