Comment on electron correlation effects in resonant inelastic x-ray scattering of NaV{sub 2}O{sub 5}.

Journal Article · Sat May 01 04:00:00 EDT 2004 · Phys. Rev. Lett.

DOI:https://doi.org/10.1103/PhysRevLett.92.219701· OSTI ID:961355

van Veenendaal, M; Fedro, A J

This is a Comment on the Letter by G.P. Zhang et al., Phys. Rev. Lett. 88, 077401 (2002). In the original article, element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV{sub 2}O{sub 5}. In contrast to single photon techniques, RIXS at the vanadium L{sub 3} edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0{+-}0.2eV.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 961355
• Report Number(s): ANL/MSD/JA-47038
• Journal Information: Phys. Rev. Lett., Journal Name: Phys. Rev. Lett. Journal Issue: 21 ; May 2004 Vol. 92; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
CORRELATIONS
ELECTRON CORRELATION
ENERGY
EXCITATION
INELASTIC SCATTERING
INTERACTIONS
PHOTONS
SCATTERING
SPECTROSCOPY
VANADIUM
X-RAY SPECTROSCOPY