Low-temperature dielectric behavior of Nb{sub 2}O{sub 5}-SiO{sub 2} solid solutions.
Dielectric properties of Nb{sub 2}O{sub 5}(0.92):SiO{sub 2}(0.08) ceramic were measured in the temperature range of 10-300 K by the cryostat system. Frequency-dependent dielectric loss suggests the relaxation behavior of this material. The relaxation mechanism was analyzed by the Arrhenius relationship and the Cole-Cole plot. Calculated distribution of relaxation time reveals deviation from the pure Debye relaxation.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- EE
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 961069
- Report Number(s):
- ANL/ET/JA-44361; JAPIAU; TRN: US201010%%899
- Journal Information:
- J. Appl. Phys., Vol. 93, Issue 5 ; Mar. 1, 2003; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- ENGLISH
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