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Title: Indentation Size Effects in Single Crystal Copper as Revealed by Synchrotron X-ray Microdiffraction

Journal Article · · Journal of Applied Physics
OSTI ID:960278

The indentation size effect (ISE) has been observed in numerous nanoindentation studies on crystalline materials; it is found that the hardness increases dramatically with decreasing indentation size - a 'smaller is stronger' phenomenon. Some have attributed the ISE to the existence of strain gradients and the geometrically necessary dislocations (GNDs). Since the GND density is directly related to the local lattice curvature, the Scanning X-ray Microdiffraction ({mu}SXRD) technique, which can quantitatively measure relative lattice rotations through the streaking of Laue diffractions, can used to study the strain gradients. The synchrotron {mu}SXRD technique we use - which was developed at the Advanced Light Source (ALS), Berkeley Lab - allows for probing the local plastic behavior of crystals with sub-micrometer resolution. Using this technique, we studied the local plasticity for indentations of different depths in a Cu single crystal. Broadening of Laue diffractions (streaking) was observed, showing local crystal lattice rotation due to the indentation-induced plastic deformation. A quantitative analysis of the streaking allows us to estimate the average GND density in the indentation plastic zones. The size dependence of the hardness, as found by nanoindentation, will be described, and its correlation to the observed lattice rotations will be discussed.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
Advanced Light Source Division
DOE Contract Number:
DE-AC02-05CH11231
OSTI ID:
960278
Report Number(s):
LBNL-1920E; JAPIAU; TRN: US0904363
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English