Edge-to-Edge Matching in Thin Films
A peculiar type of preferential orientation was recently observed in polycrystalline films that are formed by a solid-state reaction on a single crystal substrate. This texture, for which the term axiotaxy was proposed, is characterized by the preferred alignment of a low-index plane in the film to a low-index plane with the same d-spacing in the substrate. The alignment of lattice planes with nearly identical d-spacings across the interface results in a periodic structure along one direction in the plane of the interface. As a consequence of the constraint that a set of planes in the film is preferentially parallel to a set of planes in the substrate, the texture manifests itself as an off-normal fiber texture.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 960149
- Report Number(s):
- BNL--83135-2009-JA
- Journal Information:
- Metallurgical and Materials Transactions A, Journal Name: Metallurgical and Materials Transactions A Journal Issue: 3A Vol. 37A
- Country of Publication:
- United States
- Language:
- English
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