Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI

Journal Article · Tue Jan 01 00:00:00 EST 2008 · Synchrotron Radiation News

OSTI ID:959973

Zhong, Z; Bennett, D; Chapman, D; Chen, J; Connor, D; Dilmanian, A; Faulconer, L; Kao, T; Leskovjan, A

We explored diffraction enhanced imaging (DEI) in both planar and computed tomography (CT) modes for early detection of beta amyloid deposition, a hallmark feature in Alzheimer's disease (AD). Since amyloid plaques precede clinical symptoms by years, their early detection is of great interest. These findings were correlated with results from synchrotron infrared microspectroscopic imaging and X-ray fluorescence microscopy, to determine the secondary structure of the amyloid beta protein and metal concentration in the amyloid plaques, respectively.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 959973
• Report Number(s): BNL-82959-2009-JA; TRN: US1005855
• Journal Information: Synchrotron Radiation News, Vol. 21, Issue 3
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
59 BASIC BIOLOGICAL SCIENCES
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
COMPUTERIZED TOMOGRAPHY
DEPOSITION
DETECTION
DIFFRACTION
DISEASES
FLUORESCENCE
MICROSCOPY
PATHOLOGY
PROTEINS
SYMPTOMS
SYNCHROTRONS
NSLS
X-RAY FLUORESCENCE ANALYSIS
national synchrotron light source