Run-In Behavior of Nanocrystalline Diamond Coatings Studied By in Situ Tribometry

Journal Article · Thu May 14 04:00:00 EDT 2009 · Wear 265:477,2008

OSTI ID:958578

Chromik, R R; Winfrey, A L; Luning, J; Nemanich, R J; Wahl, K J

The friction performance of nanocrystalline diamond coatings was evaluated using in situ tribometry with sapphire counterfaces. Coatings were grown by microwave plasma assisted chemical vapor deposition in an Ar-H-CH{sub 4} plasma, with H ranging from 0 to 36%. In situ examination of the sliding contact, combined with ex situ analysis of the sapphire counterface revealed that the velocity accommodation mode was interfacial sliding of a carbonaceous transfer film versus the coating wear track. For most tests, the contact diameter increased during the first 50 sliding cycles and then remained constant. The in situ measure of the contact diameter was found to correlate confidently to ex situ measurements of counterface wear. The performance of the diamond coatings, characterized by quick run-in to low friction was best when a small but detectable graphite peak was present in the X-ray diffraction (XRD) profile. The relative intensity of the XRD graphite peak was also found to directly correlate with the peak position of the C1s {yields} {pi}* transition as measured by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. Increasing the relative amount of graphite-bonded sp{sup 2} carbon in the NCD films decreased run-in cycles to low friction.

• Research Organization: Stanford Linear Accelerator Center (SLAC)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76SF00515
• OSTI ID: 958578
• Report Number(s): SLAC-REPRINT-2009-115
• Journal Information: Wear 265:477,2008, Journal Name: Wear 265:477,2008 Journal Issue: 3-4 Vol. 265; ISSN 0043-1648; ISSN WEARAH
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
CARBON
CHEMICAL VAPOR DEPOSITION
COATINGS
DIAMONDS
FINE STRUCTURE
FRICTION
GRAPHITE
Other
OTHER
CHEM
PERFORMANCE
PLASMA
SAPPHIRE
SPECTROSCOPY
VELOCITY
X-RAY DIFFRACTION