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Atomic layer deposition of Cu{sub 2}S for future application in photovoltaics.

Journal Article · · Appl. Phys. Lett.
DOI:https://doi.org/10.1063/1.3094131· OSTI ID:958542

Alternating exposure to bis(N,N{prime}-di-sec-butylacetamidinato)dicopper(I) and hydrogen sulfide is shown to produce high quality chalcocite (Cu{sub 2}S) thin films by atomic layer deposition on silicon and fused silica substrates. The layer-by-layer chemical vapor deposition method enables conformal growth of the phase-pure material at 130 C. X-ray diffraction reveals that polycrystalline high-chalcocite films are deposited preferentially oriented in the <00l> plane. The optical properties of this naturally p-type absorber compare well with previous reports on single crystals, highlighting the applicability of the technique to nanostructured photovoltaics.

Research Organization:
Argonne National Laboratory (ANL)
Sponsoring Organization:
SC
DOE Contract Number:
AC02-06CH11357
OSTI ID:
958542
Report Number(s):
ANL/MSD/JA-63579
Journal Information:
Appl. Phys. Lett., Journal Name: Appl. Phys. Lett. Journal Issue: 2009 Vol. 94; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
ENGLISH