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Title: Beam emittance measurements in RHIC

Conference ·
OSTI ID:952559

The RHIC proton polarimeters can operate in scanning mode, giving polarization profiles and transverse beam intensity profile (beam emittance) measurements. The polarimeters function as wire scanners, providing a very good signal/noise ratio and high counting rate. This allows accurate bunch-by-bunch emittance measurements during fast target sweeps (<1 s) through the beam. Very thin carbon strip targets make these measurements practically non-destructive. Bunch by bunch emittance measurements are a powerful tool for machine set-up; in RHIC, individual proton beam transverse emittances can only be measured by CNI polarimeter scans. We discuss the consistency of these measurements with Ionization Profile Monitors (IPMs) and vernier scan luminosity measurements. Absolute accuracy limitations and cross-calibration of different techniques are also discussed.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
Doe - Office Of Science
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
952559
Report Number(s):
BNL-81865-2009-CP; KB0202011; TRN: US0902546
Resource Relation:
Conference: Particle Accelerator Conference; Vancouver, B.C., Canada; 20090504 through 20090508
Country of Publication:
United States
Language:
English