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Bias in Calculated keff from Subcritical Measurements by the 252Cf-source-Driven Noise Analysis Method

Technical Report ·
DOI:https://doi.org/10.2172/95236· OSTI ID:95236
 [1];  [1]
  1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
The development of MCNP-DSP, which allows direct calculation of the measured time and frequency analysis parameters from subcritical measurements using the 252Cf-source-driven noise analysis method, permits the validation of calculational methods for criticality safety with in-plant subcritical measurements. In addition, a method of obtaining the bias in the calculations, which is essential to the criticality safety specialist, is illustrated using the results of measurements with 17.771-cm-diam, enriched (93.15), unreflected, and unmoderated uranium metal cylinders. For these uranium metal cylinders the bias obtained using MCNP-DSP and ENDF/B-V cross-section data increased with subcriticality. For a critical experiment [height (h) = 12.629 cm], it was ⁻0.0061 {+-} 0.0003. For a 10.16-cm-high cylinder (k ~ 0.93), it was 0.0060 {+-} 0.0016, and for a subcritical cylinder (h = 8.13 cm, k ~ 0.85), the bias was ⁻0.0137 {+-} 0.0037, more than a factor of 2 larger in magnitude. This method allows the nuclear criticality safety specialist to establish the bias in calculational methods for criticality safety from in-plant subcritical measurements by the 252Cf-source-driven noise analysis method.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Nuclear Criticality Safety Program (NCSP)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
95236
Report Number(s):
CONF-9509100--6; ON: DE95014587
Country of Publication:
United States
Language:
English