High gain, Fast Scan, Broad Spectrum Parallel Beam Wavelength Dispersive X-ray Spectrometer for SEM
- Parallax Research, Inc.
During contract # DE-FG02-ER83545, Parallax Research, Inc. developed a High gain, Fast Scan Broad Spectrum Parallel beam Wavelength Dispersive X-ray Spectrometer for use on Scanning Electron Microscopes (SEM). This new spectrometer allows very fast high resolution elemental analysis of samples in an electron microscope. By comparison to previous WDS spectrometers, it can change from one energy position to another very quickly and has an extended range compared to some similar products.
- Research Organization:
- Parallax Research, Inc.
- Sponsoring Organization:
- Chicago Operations
- DOE Contract Number:
- FG02-02ER83545
- OSTI ID:
- 952205
- Report Number(s):
- DOE/ER/83545-FR
- Country of Publication:
- United States
- Language:
- English
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