A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

Journal Article · Tue Mar 24 00:00:00 EDT 2009 · REVIEW OF SCIENTIFIC INSTRUMENTS

OSTI ID:951782

Source, Advanced Light; Kunz, Martin; Tamura, Nobumichi; Chen, Kai; MacDowell, Alastair A; Celestre, Richard S; Church, Matthew M; Fakra, Sirine; Domning, Edward E; Glossinger, James M; Kirschman, Jonathan L; Morrison, Gregory Y; Plate, Dave W; Smith, Brian V; Warwick, Tony; Padmore, Howard A; Ustundag, Ersan; Yashchuk, Valeriy V

A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend) This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 mu m spot of ~;;5x109 photons/ s (0.1percent bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored bytwo pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 um are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (~;;0.2 mu m) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10-5 strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (~;;150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

• Research Organization: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
• Sponsoring Organization: Advanced Light Source Division; Engineering Division
• DOE Contract Number: AC02-05CH11231
• OSTI ID: 951782
• Report Number(s): LBNL-1746E
• Journal Information: REVIEW OF SCIENTIFIC INSTRUMENTS, Journal Name: REVIEW OF SCIENTIFIC INSTRUMENTS Vol. 80; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
ADVANCED LIGHT SOURCE
BEAM POSITION
BENDING
DIFFRACTION
FLUORESCENCE
GEOMETRY
MIRRORS
MONOCHROMATORS
PHOTONS
POSITIONING
RADIATIONS
RESOLUTION
SPATIAL RESOLUTION
STRAINS
TANKS
TEXTURE
VELOCITY
X RADIATION
X-RAY DIFFRACTION
x-ray beamline
x-ray microdiffraction
x-ray fluorescence
superbend.