Electron Backscatter Diffraction of a Ge Growth Tip from a Vertical Gradient Freeze Furnace

Journal Article · Fri Oct 10 04:00:00 EDT 2008 · Journal of Crystal Growth

DOI:https://doi.org/10.1016/j.jcrysgro.2008.09.183· OSTI ID:949920

Henager, Charles H. ^[1]; Edwards, Danny J. ^[1]; Schemer-Kohrn, Alan L. ^[1]; Sundaram, S. K. ^[1]; Riley, Brian J. ^[1]; Bliss, Mary ^[1]

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1. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

The growth-tip region of a high-purity 4.2-cm diameter Ge boule grown using low-pressure Bridgman methods in a vertical gradient freeze furnace was sectioned and polished in preparation for scanning electron microscopy and was characterized using electron backscatter diffraction (EBSD). The boule had a characteristic conical tip region with cone angle of 40° of a right circular cylinder from which a section was taken along the boule longitudinal centerline with an approximate surface area of 4 cm². The majority of this surface area was characterized using EBSD and an image collage was assembled for the tip region. The grain structure, grain boundary orientation, twin structure, and overall crystal growth direction were determined. A crystal growth direction of approximately <112> was observed, which was also identified as the growth direction of several prominent twins observed in the tip region. The grain structure of the tip region appeared to be controlled by the sidewall nucleation of a stray grain that competed for dominance during growth. Grain boundaries and triple grain junctions were identified as low-energy coincident-site-lattice (CSL) boundaries and junctions of the Σ3 and Σ9 types.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States), Environmental Molecular Sciences Laboratory (EMSL)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 949920
• Report Number(s): PNNL-SA--61619; 25682; NN2001000
• Journal Information: Journal of Crystal Growth, Journal Name: Journal of Crystal Growth Journal Issue: 1 Vol. 311; ISSN 0022-0248; ISSN JCRGAE
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BACKSCATTERING
BRIDGMAN METHOD
Bridgman technique
CRYSTAL GROWTH
Characterization
Defects
ELECTRON DIFFRACTION
Environmental Molecular Sciences Laboratory
FURNACES
GERMANIUM
GRAIN BOUNDARIES
NUCLEATION
ORIENTATION
Planar defects
SURFACE AREA
Semiconducting germanium
Solidification