Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Comparison of texture development and superconducting properties of YBCO thin films prepared by TFA and PLD processes.

Journal Article · · Physica C

Although pulsed laser deposition (PLD) is one of the most reliable techniques for fabricating YBa{sub 2}Cu{sub 3}O{sub x} (YBCO) thin films with high critical current density (J{sub c}), metal organic decomposition (MOD), including the trifluoroacetate (TFA) process, is attracting more interest because of its potential for scale-up and cost-effectiveness. In general, PLD samples have higher J{sub c} values than those of TFA samples. In this study, we deposited YBCO films on LaAlO{sub 3} single-crystal substrates by TFA and PLD, respectively. Performance of the two samples was compared to investigate possible causes that lead to the different J{sub c} values. In-plane and out-of-plane texture was evaluated quantitatively by phi and omega scan, respectively. The FWHMs of phi and omega scans for the TFA sample were comparable to those of the PLD sample, indicating that TFA films follow the substrate texture precisely. Raman spectra were measured to estimate grain connectivity, texture, and second-phase formation. The properties of the samples are almost identical, except for the intensity of the BaCuO{sub 2} Raman peaks. Microstructure observation by SEM showed that TFA films were generally more porous and smaller-grained than PLD samples. Considering these results, the difference in J{sub c} values between TFA and PLD samples (1.3 and 3 MA/cm{sup 2}, respectively) in this experiment is partly attributed to the more porous microstructure of the TFA samples.

Research Organization:
Argonne National Laboratory (ANL)
Sponsoring Organization:
EE
DOE Contract Number:
AC02-06CH11357
OSTI ID:
943181
Report Number(s):
ANL/ET/JA-38071
Journal Information:
Physica C, Journal Name: Physica C Journal Issue: 4 ; Aug. 1, 2001 Vol. 356; ISSN 0921-4534; ISSN PHYCE6
Country of Publication:
United States
Language:
ENGLISH