A summary of the XAFS X Conference in Chicago.
On August 10-14, 1998, the 10th International Conference on X-ray Absorption Fine Structure (XAFS X) was held on the Illinois Institute of Technology campus in Chicago. This is one of the major synchrotron radiation conferences, held every two years since 1981 when the first international meeting of XAFS experts was held in Daresbury, coincident with the operation of the first of the second-generation dedicated synchrotron radiation sources. The XAFS conferences have evolved over the years with the more recent conferences covering not only the advances in instrumentation, theory and method but also their applications in disciplines ranging from biological to environmental sciences. Approximately 360 scientists from 23 countries attended the conference. The program consisted of 467 abstracts for plenary talks, invited talks, contributed talks, and posters. The co-chairs for the conference were B. Bunker, S. Heald, and T. Morrison and the Program Chair was J. Penner-Hahn. The first IXS award for career contributions to the field was presented to F. Lytle who gave a plenary talk on 'The EXAFS Family Tree: History of the Development of X-ray Absorption Spectroscopy'. In addition, awards were given for the best poster by a young scientist at each session. The winners were M. Duff, D. Cabaret and S. Rossano. The International Union of Crystallography (IUCr) also sponsored poster prizes for the best posters in the areas of biology and instrumentation and methods. These winners were A. Templeton and M. Suzuki.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- LDRD
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 942585
- Report Number(s):
- ANL/ER/JA-32786
- Journal Information:
- Sychrotron Radiat. News, Journal Name: Sychrotron Radiat. News Journal Issue: 4 ; 1999 Vol. 12; ISSN 0894-0886
- Country of Publication:
- United States
- Language:
- ENGLISH
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