Parallel approaches for probabilistic short-circuit studies
Conference
·
OSTI ID:94242
- Raytheon Engineers and Constructors, Downers Grove, IL (United States)
- Illinois Inst. of Tech., Chicago, IL (United States). Electrical and Computer Engineering Dept.
This paper presents a review of the issues in the choice of an approach for probabilistic short-circuit studies. The main issues are: (1) exploiting network matrix sparsity, (2) system dependent sampling, (3) handling of mutual coupling efficiently, (4) external network representation, and (5) network matrix modification to incorporate faults. The paper then discusses strategies for using recent advances in parallel computing for overcoming the computational limitations of the probabilistic short-circuit studies.
- OSTI ID:
- 94242
- Report Number(s):
- CONF-950414--
- Country of Publication:
- United States
- Language:
- English
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