Combined x-ray and neutron diffraction from binary liquids and amorphous semiconductors.

Journal Article · Sun Aug 01 04:00:00 EDT 1999 · J. Non-Cryst. Solids

DOI:https://doi.org/10.1016/S0022-3093(99)00308-7· OSTI ID:942375

Barnes, A C; Hamilton, M A; Buchanan, P; Saboungi, M -L

Neutron scattering and isotopic substitution has been established as a method of unambiguously determining the partial structure factors of binary liquid and amorphous materials. In this paper we present results of an extension of this method to include X-ray diffraction as a method of enhancing the structural information obtained. We have applied a combination of two neutron diffraction experiments using isotopic substitution and one X-ray diffraction experiment to obtain the partial structure factors and pair distribution functions of liquid TlSe. We have applied the anomalous X-ray diffraction technique to glassy PSe using the Se K-edge. The results show that the first sharp diffraction peak observed in this glass arises almost entirely from the P-P correlations. We have applied the combined X-ray anomalous scattering and neutron diffraction technique to obtain the partial structure factors of glassy GeO{sub 2}. The results from two independent data sets have been compared and are in good agreement.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: ER
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 942375
• Report Number(s): ANL/MSD/JA-30797
• Journal Information: J. Non-Cryst. Solids, Journal Name: J. Non-Cryst. Solids Journal Issue: Pt. 2 ; Aug. 1999 Vol. 252; ISSN JNCSBJ; ISSN 0022-3093
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
CORRELATIONS
DATA
DIFFRACTION
DISTRIBUTION FUNCTIONS
GLASS
INFORMATION
ISOTOPIC EXCHANGE
LIQUIDS
MATERIALS
NEUTRON DIFFRACTION
NEUTRONS
PEAKS
SCATTERING
STRUCTURE FACTORS
X-RAY DIFFRACTION