Strain-induced Polarization Rotation in Epitaxial (001) BiFeO3 Thin Films

Journal Article · Tue Jan 01 04:00:00 EST 2008 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.101.107602· OSTI ID:939399

Jang, J H ^[1]; Baek, S H ^[2]; Ortiz, D ^[2]; Das, R ^[2]; Folkman, C H ^[2]; Chu, Y H ^[2]; Shafer, Paul ^[2]; Zhang, J X ^[2]; S, Choudhury ^[3]; Vaithyanathan, V ^[3]; Chen, Y B ^[4]; Felker, D A ^[2]; Biegalski, Michael D ^[5]; Rzchowski, M ^[2]; Pan, X Q ^[4]; Chen, Long-Qing ^[3]; Schlom, Darrell ^[3]; Ramesh, R. ^[6]; Eom, Chang-Beom ^[5]

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1. Univeristy of Wisconsson
2. University of Wisconsin
3. Pennsylvania State University
4. University of Michigan
5. ORNL
6. University of California, Berkeley

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain-dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 939399
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 10 Vol. 101; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BISMUTH OXIDES
EPITAXY
IRON OXIDES
POLARIZATION
ROTATION
STRAINS
THERMODYNAMICS
THIN FILMS