High-resolution detection system for time-of-flight electron spectrometry
One of the key components of a time-of-flight (TOF) spectrometer is the detection system. In addition to high timing resolution, accurate two-dimensional imaging substantially broadensthe areas of applications of TOF spectrometers; for example, add a new dimension to angle-resolved photoemission spectroscopy (ARPES). In this paper we report on the recent developments of a high spatial (<50 mm) and timing (<130 ps) resolution imaging system capable of selective detection of electrons, ions and/or photons. Relative to our previously reported results, we have substantially improved the counting rate capabilities of the system especially for cases where the energy range of interest represents a small fraction of the incoming flux at the detector plane. The new system ignores all the events outside of a tunable time window substantially decreasing the dead time required for the event processing. That allows high-resolution TOF measurements within a given energy or momentum range and also can be used for distinguishing (or disabling) detection of photons versus detection of charged particles. The counting rate within a given energy window can be as high as ~;;400KHz at 10percent dead time. The electron detection system reported in the paper was developed for the TOF ARPES experiments at the Advanced Light Source, Lawrence Berkeley National Laboratory.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Advanced Light Source Division
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 936738
- Report Number(s):
- LBNL-883E
- Journal Information:
- Nuclear Instruments and Methods in Physics Research A, Journal Name: Nuclear Instruments and Methods in Physics Research A Vol. 582
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADVANCED LIGHT SOURCE
CHARGED PARTICLES
COUNTING RATES
DEAD TIME
DETECTION
DIMENSIONS
ELECTRON DETECTION
ELECTRONS
ENERGY RANGE
Event counting detectors
High spatial and temporal resolution
PHOTOEMISSION
PHOTONS
PROCESSING
RESOLUTION
SPECTROMETERS
SPECTROSCOPY
Synchrotron instrumentation