Charge injection into small semiconductor particles
Conference
·
OSTI ID:93627
We report on the effect of the injection of electrons into small CdS particles on their spectroscopy. Solvated electrons were generated pulse radiolytically and their reaction with the particles was monitored. As a result of the excess charge, the absorption by the particle in the exciton region is bleached. The bleaching tacks the shift in band edge as the particle size decreases. However, excess electrons in larger particles are more efficient tan in small particles. It is concluded that the effort originates in the electric field effect generated by the excess charge.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 93627
- Report Number(s):
- ANL/CHM/CP--85038; CONF-950518--13; ON: DE95013467
- Country of Publication:
- United States
- Language:
- English
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