Charge injection into small semiconductor particles
Conference
·
OSTI ID:93627
We report on the effect of the injection of electrons into small CdS particles on their spectroscopy. Solvated electrons were generated pulse radiolytically and their reaction with the particles was monitored. As a result of the excess charge, the absorption by the particle in the exciton region is bleached. The bleaching tacks the shift in band edge as the particle size decreases. However, excess electrons in larger particles are more efficient tan in small particles. It is concluded that the effort originates in the electric field effect generated by the excess charge.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 93627
- Report Number(s):
- ANL/CHM/CP-85038; CONF-950518-13; ON: DE95013467
- Resource Relation:
- Conference: 187. meeting of the Electrochemical Society, Reno, NV (United States), 21-26 May 1995; Other Information: PBD: [1995]
- Country of Publication:
- United States
- Language:
- English
Similar Records
Radiolytic production and properties of ultrasmall CdS particles
Excess charges in semiconductor nanocrystallites
Photochemistry of semiconductor colloids. 22. Electron injection from illuminated CdS into attached TiO/sub 2/ and ZnO particles
Journal Article
·
Thu Jun 01 00:00:00 EDT 1989
· Journal of Physical Chemistry; (USA)
·
OSTI ID:93627
+2 more
Excess charges in semiconductor nanocrystallites
Conference
·
Thu Jun 01 00:00:00 EDT 1995
·
OSTI ID:93627
+1 more
Photochemistry of semiconductor colloids. 22. Electron injection from illuminated CdS into attached TiO/sub 2/ and ZnO particles
Journal Article
·
Wed Oct 28 00:00:00 EST 1987
· J. Am. Chem. Soc.; (United States)
·
OSTI ID:93627