Comparison of two methods for simulation of hard X-ray nanofocusing by elliptical mirrors.
Wave-optical calculations are essential for predicting the X-ray focusing performance of precisely figured elliptical mirrors. The complex wavefield in the vicinity of the focal plane of a mirror with RMS height error in the nanometer range compared to the best-fit ellipse has been calculated using two methods. A pupil function method that treats the surface topography of a mirror as an aberration to a perfect ellipse was used to obtain the reflected amplitude and phase around the focal point downstream. The results were compared with direct propagation of waves from a point source, and it was found that both methods were in good agreement. Each approach provides advantages that are useful in designing mirrors to achieve diffraction limited focusing.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 935929
- Report Number(s):
- ANL/XSD/CP-60142; TRN: US0804773
- Journal Information:
- Nucl. Instrum. Methods Phys. Res. A, Vol. 582, Issue 1 ; Nov. 11, 2007; Conference: Synchrotron Radiation Instrumentatioin (SRI2007); Apr. 25, 2007 - Apr. 28, 2007; Baton Rouge, LA
- Country of Publication:
- United States
- Language:
- ENGLISH
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