Studying Nanoscale Magnetism and its Dynamics with Soft X-ray Microscopy
Journal Article
·
· Institute of Electrical and Electronics Engineers (IEEE)
OSTI ID:934674
Magnetic soft X-ray microscopy allows for imaging magnetic structures at a spatial resolution down to 15nm and a time resolution in the sub-100ps regime. Inherent elemental specificity can be used to image the magnetic response of individual components such as layers in multilayered systems. This review highlights current achievements and discusses the future potential of magnetic soft X-ray microscopy at fsec X-ray sources where snapshot images of ultrafast spin dynamics with a spatial resolution below 10nm will become feasible.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- Materials Sciences Division
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 934674
- Report Number(s):
- LBNL-384E; TRN: US200814%%405
- Journal Information:
- Institute of Electrical and Electronics Engineers (IEEE), Journal Name: Institute of Electrical and Electronics Engineers (IEEE)
- Country of Publication:
- United States
- Language:
- English
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