Breakdown Limits on Gigavolt-per-Meter Electron-Beam-Driven Wakefields in Dielectric Structures

Journal Article · Tue Jun 17 00:00:00 EDT 2008 · Phys.Rev.Lett.100:214801,2008

DOI:https://doi.org/10.1103/PhysRevLett.100.214801· OSTI ID:933022

Thompson, M C; Badakov, H; Cook, A M; Rosenzweig, J B; Tikhoplav, R; Travish, G; Blumenfeld, I; Hogan, M J; Ischebeck, R; Kirby, N; Siemann, R; Walz, D; Muggli, P; Scott, A; Yoder, R B

First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made. Fused silica tubes of 100 {micro}m inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27 GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8 {+-} 0.7 GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.

• Research Organization: Stanford Linear Accelerator Center (SLAC)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76SF00515
• OSTI ID: 933022
• Report Number(s): SLAC-PUB-13257
• Journal Information: Phys.Rev.Lett.100:214801,2008, Journal Name: Phys.Rev.Lett.100:214801,2008 Vol. 100; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Accelerators
ACCPHY
BREAKDOWN
DIELECTRIC MATERIALS
ELECTRIC FIELDS
ELECTRONS
SILICA