An ultrafast x-ray detector system at an elliptically polarizingundulator beamline
An ultrafast x-ray detector system is under development atLawrence Berkeley National Laboratory (LBNL) for application primarily tostudyies of ultrafast magnetization dynamics. The system consists of a fslaser, an x-ray streak camera and an ellipitically polarization undulator(EPU) beamline. Polarized x-rays from an EPU can be used to measure x-raymagnetic circular dichroism (XMCD) of a sample. XMCD has the uniqueability to independently measure orbit and spin magnetization withsub-monolayer sensitivity and element specificity. The streak camera hassimultaneously a sub-picosecond temporal resolution and a high spatialresolution. The combination of the streak camera and EPU allows us tostudy the transfer of angular momentum from spin to orbit to the latticein the sample on an ultrafast time scale. We describe here theperformance of the ultrafast detector, the laser and the x-raysynchronization system. The observation of the demagnetization process ofdifferent samples demonstrates the ability of the apparatus.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Advanced Light Source(ALS)
- Sponsoring Organization:
- USDOE Director, Office of Science
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 932498
- Report Number(s):
- LBNL-63526; TRN: US0803549
- Journal Information:
- Nuclear Instruments and Methods in Physics ResearchA, Vol. 582; Related Information: Journal Publication Date: 08/15/2007
- Country of Publication:
- United States
- Language:
- English
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