Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Phase Relations in the Ba-Y-Cu-O Films on SrTiO3 for the Ex Situ BaF2 Process

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2713124· OSTI ID:931502
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3]
  1. National Institute of Standards and Technology (NIST)
  2. ORNL
  3. Los Alamos National Laboratory (LANL)
In situ x-ray diffraction was used to establish the phase relations in high-{Tc} superconductor Ba-Y-Cu-O films grown on SrTiO{sub 3} through the ex situ BaF{sub 2} process. These relations differ from bulk equilibrium phase assemblages in the BaO-Y{sub 2}O{sub 3}-CuO{sub x} system. In particular, BaY2CuO5 (the 'green phase'), a common impurity phase in bulk processing, is absent in the films. Because of the absence of this green phase, the compositional stability field of Ba{sub 2}YCu{sub 3}O{sub 6+x} expands considerably as compared to that of the bulk system, resulting in the tie lines Ba{sub 2}YCu{sub 3}O{sub 6+x}-Y{sub 2}O{sub 3} and Ba{sub 2}YCu{sub 3}O{sub 6+x}-Y{sub 2}Cu{sub 2}O{sub 5}.
Research Organization:
Oak Ridge National Laboratory (ORNL)
Sponsoring Organization:
OE USDOE - Office of Electric Transmission and Distribution
DOE Contract Number:
AC05-00OR22725
OSTI ID:
931502
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 90; ISSN 0003-6951; ISSN APPLAB
Country of Publication:
United States
Language:
English

Similar Records

Nature of the Transient BaF2-Related Phases in the "BaF2" Processing of Ba2YCu3O7-x Superconductors
Journal Article · Sat Dec 31 23:00:00 EST 2005 · Applied Physics Letters · OSTI ID:930732

Melting Investigation of the System BaF2-BaO-½Y2O3-CuOx-H2O
Journal Article · Fri Dec 31 23:00:00 EST 2004 · Superconductor Science & Technology · OSTI ID:1003056

Preparation of high T/sub c/ and J/sub c/ films of Ba/sub 2/YCu/sub 3/O/sub 7/ using laser evaporation of a composite target containing BaF/sub 2/
Journal Article · Mon Jun 06 00:00:00 EDT 1988 · Appl. Phys. Lett.; (United States) · OSTI ID:5045602