Local Environment sSrrounding S and Cd in CdS:O Thin Film Photovoltaic Materials Probed by X-ray Absorption Fine Structures

Journal Article · Sun Jan 01 00:00:00 EST 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2356995· OSTI ID:930602

Soo, Y; Sun, W; Weng, S; Lin, Y; Chang, S; Jang, L; Wu, X; Yan, Y

Local environments surrounding Cd and S in CdS:O thin films have been determined using extended x-ray absorption fine structure (EXAFS) and near-edge x-ray absorption fine structure (NEXAFS). As indicated by the Cd EXAFS, Cd atoms remain predominantly bonded with S. The S EXAFS and NEXAFS clearly demonstrate the presence of S-O bonds. The oxygen atoms actually combine with S to form SO{sub 3} and SO{sub 4} complexes. Combined with the transmission electron micrograph, these x-ray results suggest formation of oxygen-free CdS nanocrystals and provide an unambiguous explanation for the mystery of increased band gap that appears to violate the band anticrossing model.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 930602
• Report Number(s): BNL-80899-2008-JA; APPLAB; TRN: US200904%%612
• Journal Information: Applied Physics Letters, Vol. 89, Issue 13; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
14 SOLAR ENERGY
CADMIUM SULFIDES
ELECTRONIC STRUCTURE
ABSORPTION SPECTROSCOPY
CHEMICAL BONDS
FINE STRUCTURE
THIN FILMS
X-RAY SPECTROSCOPY
ENERGY GAP
PHOTOVOLTAIC CELLS
national synchrotron light source