Deduction of the Temperature-Dependent Structure of the Four-Layer Intermidiate Smectic Phase using Resonant X-ray Scattering

Journal Article · Mon Jan 01 04:00:00 EST 2007 · European Physical Journal E

DOI:https://doi.org/10.1140/epje/i2007-10189-0· OSTI ID:929964

Brimicombe, P; Roberts, N; Jaradat, S; Southern, C; Wang, S; Huang, C; DiMasi, E; Pindak, R; Gleeson, H

A binary mixture of an antiferroelectric liquid-crystal material containing a selenium atom and a highly chiral dopant is investigated using resonant X-ray scattering. This mixture exhibits a remarkably wide four-layer intermediate smectic phase, the structure of which is investigated over a temperature range of 16K. Analysis of the resonant X-ray scattering data allows accurate measurement of both the helicoidal pitch and the distortion angle as a function of temperature. The former decreases rapidly as the SmC * phase is approached, whilst the latter remains constant over the temperature range studied at 8{sup o} {+-} 3{sup o}. We also observe that the senses of the helicoidal pitch and the unit cell of the repeating four-layer structure are opposite in this mixture and that there is no pitch inversion over the temperature range studied.

• Research Organization: Brookhaven National Laboratory (BNL) National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 929964
• Report Number(s): BNL--80568-2008-JA
• Journal Information: European Physical Journal E, Journal Name: European Physical Journal E Vol. 23
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANTIFERROELECTRIC MATERIALS
BINARY MIXTURES
LIQUID CRYSTALS
MORPHOLOGY
PHASE STUDIES
SELENIUM COMPOUNDS
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION
national synchrotron light source