Glass particles produced by laser ablation for ICP-MSmeasurements

Journal Article · Fri Jun 01 04:00:00 EDT 2007 · Talanta

DOI:https://doi.org/10.1016/j.talanta.2007.04.028· OSTI ID:928888

Gonzalez, J; Liu, C; Wen, S; Mao, X; Russo, R E

Pulsed laser ablation (266nm) was used to generate glass particles from two sets of standard reference materials using femtosecond (150fs) and nanosecond (4ns) laser pulses with identical fluences of 50 J cm{sup -2}. Scanning electron microscopy (SEM) images of the collected particles revealed that there are more and larger agglomerations of particles produced by nanosecond laser ablation. In contrast to the earlier findings for metal alloy samples, no correlation between the concentration of major elements and the median particle size was found. When the current data on glass were compared with the metal alloy data, there were clear differences in terms of particle size, crater depth, heat affected zone, and ICP-MS response. For example, glass particles were larger than metal alloy particles, the craters in glass were less deep than craters in metal alloys, and damage to the sample was less pronounced in glass compared to metal alloys samples. The femtosecond laser generated more intense ICP-MS signals compared to nanosecond laser ablation for both types of samples, although glass sample behavior was more similar between ns and fs-laser ablation than for metals alloys.

• Research Organization: Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
• Sponsoring Organization: USDOE. Administrator for National Nuclear Security AdminNonproliferation and National Security Program Direction
• DOE Contract Number: AC02-05CH11231
• OSTI ID: 928888
• Report Number(s): LBNL--63618; BnR: NN2001000
• Journal Information: Talanta, Journal Name: Talanta Vol. 73; ISSN 0039-9140; ISSN TLNTA2
• Country of Publication: United States
• Language: English

Related Subjects

25 ENERGY STORAGE
ABLATION
ALLOYS
CALIBRATION STANDARDS
GLASS
HEAT AFFECTED ZONE
LASERS
PARTICLE SIZE
SCANNING ELECTRON MICROSCOPY