Post-buckling analysis for the precisely controlled buckling of thin film encapsulated by elastomeric subsrates.
The precisely controlled buckling of stiff thin films (e.g., Si or GaAs nano ribbons) on the patterned surface of elastomeric substrate (e.g., poly(dimethylsiloxane) (PDMS)) with periodic inactivated and activated regions was designed by Sun et al. [Sun, Y., Choi, W.M., Jiang, H., Huang, Y.Y., Rogers, J.A., 2006. Controlled buckling of semiconductor nanoribbons for stretchable electronics. Nature Nanotechnology 1, 201-207] for important applications of stretchable electronics. We have developed a post-buckling model based on the energy method for the precisely controlled buckling to study the system stretchability. The results agree with Sun et al.'s (2006) experiments without any parameter fitting, and the system can reach 120% stretchability.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- SC; DARPA; NSF
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 928293
- Report Number(s):
- ANL/CNM/JA-59984
- Journal Information:
- Int. J. Solids Struct., Journal Name: Int. J. Solids Struct. Journal Issue: 7-8 ; Apr. 2008 Vol. 45; ISSN 0020-7683
- Country of Publication:
- United States
- Language:
- ENGLISH
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