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Title: Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate

Abstract

No abstract prepared.

Authors:
; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
928196
Report Number(s):
UCRL-TR-221613
TRN: US200815%%775
DOE Contract Number:
W-7405-ENG-48
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUMM MECHANICS, GENERAL PHYSICS; MICROSCOPES; SUBSTRATES; PHYSICS

Citation Formats

Soufli, R, Baker, S L, and Robinson, J C. Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate. United States: N. p., 2006. Web. doi:10.2172/928196.
Soufli, R, Baker, S L, & Robinson, J C. Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate. United States. doi:10.2172/928196.
Soufli, R, Baker, S L, and Robinson, J C. Wed . "Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate". United States. doi:10.2172/928196. https://www.osti.gov/servlets/purl/928196.
@article{osti_928196,
title = {Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate},
author = {Soufli, R and Baker, S L and Robinson, J C},
abstractNote = {No abstract prepared.},
doi = {10.2172/928196},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Feb 22 00:00:00 EST 2006},
month = {Wed Feb 22 00:00:00 EST 2006}
}

Technical Report:

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