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Title: Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate


No abstract prepared.

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Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
OSTI Identifier:
Report Number(s):
TRN: US200815%%775
DOE Contract Number:
Resource Type:
Technical Report
Country of Publication:
United States

Citation Formats

Soufli, R, Baker, S L, and Robinson, J C. Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate. United States: N. p., 2006. Web. doi:10.2172/928196.
Soufli, R, Baker, S L, & Robinson, J C. Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate. United States. doi:10.2172/928196.
Soufli, R, Baker, S L, and Robinson, J C. Wed . "Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate". United States. doi:10.2172/928196.
title = {Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate},
author = {Soufli, R and Baker, S L and Robinson, J C},
abstractNote = {No abstract prepared.},
doi = {10.2172/928196},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Feb 22 00:00:00 EST 2006},
month = {Wed Feb 22 00:00:00 EST 2006}

Technical Report:

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  • The summary of Atomic Force Microscope (AFM) on Sagem 05R0025 secondary substrate: (1) 2 x 2 {micro}m{sup 2} and 10 x 10 {micro}m{sup 2} AFM measurements and analysis on Sagem 05R0025 secondary substrate at LLNL indicate rather uniform and extremely isotropic finish across the surface, with high-spatial frequency roughness {sigma} in the range 5.1-5.5 {angstrom} rms; (2) the marked absence of pronounced long-range polishing marks in any direction, combined with increased roughness in the very high spatial frequencies, are consistent with ion-beam polishing treatment on the surface. These observations are consistent with all earlier mirrors they measured from the samemore » vendor; and (3) all data were obtained with a Digital Instruments Dimension 5000{trademark} atomic force microscope.« less
  • The atomic force microscope (AFM) offers a rich observation window on the nanoscale, yet many dynamic phenomena are too fast and too weak for direct AFM detection. Integrated cavity-optomechanics is revolutionizing micromechanical sensing; however, it has not yet impacted AFM. Here, we make a groundbreaking advance by fabricating picogram-scale probes integrated with photonic resonators to realize functional AFM detection that achieve high temporal resolution (<10 ns) and picometer vertical displacement uncertainty simultaneously. The ability to capture fast events with high precision is leveraged to measure the thermal conductivity (η), for the first time, concurrently with chemical composition at the nanoscalemore » in photothermal induced resonance experiments. The intrinsic η of metal–organic-framework individual microcrystals, not measurable by macroscale techniques, is obtained with a small measurement uncertainty (8%). The improved sensitivity (50×) increases the measurement throughput 2500-fold and enables chemical composition measurement of molecular monolayer-thin samples. In conclusion, our paradigm-shifting photonic readout for small probes breaks the common trade-off between AFM measurement precision and ability to capture transient events, thus transforming the ability to observe nanoscale dynamics in materials.« less
  • An atomic force microscope was acquired and used to study the surface properties of polymers and ceramics. Studies of polymers included nanomachining, mechanical properties, wetting behavior of latex, and metallization. Studies of ceramics included faceting of TiO2 morphology of oxide fracture surfaces, heteroepitaxial oxide film growth, and oxidation of vanadium carbide. A prototype instrument for use in ultra-high vacuum was designed. Atomic force microscope, Ceramics, Polymers, Surface structure, Thin films, Adhesion, Micromechanics.
  • Atomic force microscopes (AFMs) are a recent development representing the state of the art in measuring ultrafine surface features. Applications are found in such fields of research as biology, microfabrication, material studies, and surface chemistry. Fiber-optic interferometer techniques developed at LLNL offer the potential of improving the vertical resolution of these instruments by up to 2 orders of magnitude. We are attempting to replace the current AFM measurement scheme, which consists of an optical beam deflection approach, with our fiber-optic interferometer scheme, a much more sensitive displacement measurement technique. In performing this research, we hope to accomplish two important goals;more » (1) to enhance the sensitivity of the AFM, and (2) to achieve important improvements in our fiber-optic interferometer technology.« less
  • The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.