Strains in thermally growing alumina films measured in-situ using synchrotron x-rays.

Conference · Sat Jan 01 04:00:00 EST 2005 · Mater. Sci. Forum

OSTI ID:925308

Hou, P Y; Paulikas, A P; Veal, B W; LBNL,

Strains in thermally grown oxides have been measured in-situ, as the oxides develop and evolve. Extensive data have been acquired from oxides grown in air at elevated temperatures on different model alloys that form Al{sub 2}O{sub 3}. Using synchrotron x-rays at the Advanced Photon Source (Beamline 12BM, Argonne National Laboratory), Debye-Scherrer diffraction patterns from the oxidizing specimen were recorded every 5 minutes during oxidation and subsequent cooling. The diffraction patterns were analyzed to determine strains in the oxides, as well as phase changes and the degree of texture. To study a specimen's response to stress perturbation, the oxidizing temperature was quickly cooled from 1100 to 950 C to impose a compressive thermal stress in the scale. This paper describes this new experimental approach and gives examples from oxidized {beta}-NiAl, Fe-20Cr-10Al, Fe-28Al-5Cr and H2-annealed Fe-28Al-5Cr (all at. %) alloys to illustrate some current understanding of the development and relaxation of growth stresses in Al{sub 2}O{sub 3}.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 925308
• Report Number(s): ANL/MSD/CP-118246
• Conference Information: Journal Name: Mater. Sci. Forum Journal Issue: 2005 Journal Volume: 522-523
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED PHOTON SOURCE
AIR
ALLOYS
CORROSION
DIFFRACTION
OXIDATION
OXIDES
RELAXATION
STRAINS
STRESSES
SYNCHROTRONS
TEXTURE