A Variation of the F-Test for Determining Statistical Relevance ofParticular Parameters in EXAFS Fits
A general problem when fitting EXAFS data is determining whether particular parameters are statistically significant. The F-test is an excellent way of determining relevancy in EXAFS because it only relies on the ratio of the fit residual of two possible models, and therefore the data errors approximately cancel. Although this test is widely used in crystallography (there, it is often called a 'Hamilton test') and has been properly applied to EXAFS data in the past, it is very rarely applied in EXAFS analysis. We have implemented a variation of the F-test adapted for EXAFS data analysis in the RSXAP analysis package, and demonstrate its applicability with a few examples, including determining whether a particular scattering shell is warranted, and differentiating between two possible species or two possible structures in a given shell.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director. Office of Science. Basic EnergySciences
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 923652
- Report Number(s):
- LBNL-62566; R&D Project: 403005; BnR: KC0302030; TRN: US200804%%1378
- Resource Relation:
- Conference: The 13th International Conference on X-rayAbsorption Fine Structure, Stanford, CA, July 2006
- Country of Publication:
- United States
- Language:
- English
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