Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces
Journal Article
·
· Journal of Applied Physics
OSTI ID:920274
The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.
- Research Organization:
- Stanford Linear Accelerator Center (SLAC)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76SF00515;
- OSTI ID:
- 920274
- Report Number(s):
- SLAC-PUB-13020
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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