A monolithic constant-fraction discriminator using distributed R-C delay-line shaping
- Oak Ridge National Lab., TN (United States)
- Univ. of Tennessee, Knoxville, TN (United States)
A monolithic, CMOS, constant-fraction discriminator (CFD) was fabricated in the Orbit Semiconductor, 1.2 {mu} N-well process. This circuit uses an on-chip, distributed, R-C delay-line to realize the constant-fraction shaping. The delay-line is constructed from a narrow, 500-{mu} serpentine layer of polysilicon above a wide, grounded, second layer of polysilicon. This R-C delay-line generates about 1.1 ns of delay for 5 ns risetime signals with a slope degradation of only {approx_equal} 15% and an amplitude reduction of about 6.1%. The CFD also features an automatic walk adjustment. The entire circuit, including the delay line, has a 200 {mu} pitch and is 950 {mu} long. The walk for a 5 ns risetime signal was measured as {plus_minus} 100 ps over the 100:1 dynamic range from {minus}15 mV to {minus}1.5 mV. to {minus}1.5 V. The CFD consumes 15 mW.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 91883
- Report Number(s):
- CONF-951073--3; ON: DE95012876; CNN: osntin
- Country of Publication:
- United States
- Language:
- English
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