Improvements in the Low Energy Collection Efficiency of Si(Li) X-ray Detectors

Journal Article · Sat Jan 01 04:00:00 EST 2005 · Nucl. Instrum. Meth. B

DOI:https://doi.org/10.1016/j.nimb.2005.07.091· OSTI ID:913665

Cox, C; Fischer, D; Schwartz, W; Song, Y

Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for energy dispersive spectroscopy. However, the measurement of X-rays below 1 keV is compromised by absorption in the material layers in front of the active crystal and a dead layer at the crystal surface. Various Schottky barrier type contacts were investigated resulting in a 40% reduction of the dead-layer thickness and a factor of two increased sensitivity at carbon K{sub {alpha}} compared to the standard Si(Li) detector. Si(Li) detectors were tested on the U7A soft X-ray beam-line at the National Synchrotron Light Source and on a scanning electron microscope (SEM).

• Research Organization: Brookhaven National Laboratory (BNL) National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 913665
• Report Number(s): BNL--78233-2007-JA
• Journal Information: Nucl. Instrum. Meth. B, Journal Name: Nucl. Instrum. Meth. B Journal Issue: 1-4 Vol. 241; ISSN 0168-583X; ISSN NIMBEU
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION
CARBON
EFFICIENCY
ELECTRON MICROSCOPES
LI-DRIFTED SI DETECTORS
NSLS
SENSITIVITY
SPECTROSCOPY
THICKNESS
national synchrotron light source