X-ray photoelectron spectroscopic analysis of oxidized Fe-16Cr-16Ni-2Mn-1Mo-2Si austenitic stainless steel

Journal Article · Fri Mar 30 00:00:00 EDT 2007 · Applied Surface Science

DOI:https://doi.org/10.1016/j.apsusc.2006.10.060· OSTI ID:913354

Poston, Jr, J A; Siriwardane, R V; Dunning, J S; Alman, D E; Rawers, J C

Depth profile analysis (argon ion etching/X-ray photoelectron spectroscopy) was conducted on a series of Fe–16Cr–16Ni–2Mn–1Mo–2Si austenitic stainless steel samples oxidized at 973 and 1073 K with exposure times of 25, 100, 193, 436 and 700 h. Surface and near surface rearrangement following oxidation resulted in a region of high Cr concentration on all oxidized samples. Temperature and time dependence to O2 penetration depth was observed. In general, O2 penetration depth was found to increase with increasing exposure up to 436 h. No increase in depth was observed between 436 and 700 h exposure time.

• Research Organization: National Energy Technology Laboratory (NETL), Pittsburgh, PA, Morgantown, WV, and Albany, OR (United States)
• Sponsoring Organization: USDOE - Office of Fossil Energy (FE)
• DOE Contract Number: None cited
• OSTI ID: 913354
• Report Number(s): DOE/NETL-IR-2007-108
• Journal Information: Applied Surface Science, Vol. 253, Issue 11; ISSN 0169-4332
• Publisher: Elsevier B.V.
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Austenitic stainless steel alloys
High temperature stainless steels
Oxidation
Oxidation resistance
Depth profile