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Microelectrode Array Microscopy: Investigation of Dynamic Behavior of Localized Corrosion at Type 304 Stainless Steel Surfaces

Journal Article · · Analytical Chemistry
DOI:https://doi.org/10.1021/ac0485785· OSTI ID:912305

Scanning electrochemical microscopy (SECM) and a recently developed microelectrode array microscope have been used to study localized corrosion and electron-transfer characteristics of native oxide layers of type 304 stainless steels. The I-/I3- redox couple was employed as a mediator and allowed sensitive detection of oxide breakdown events. In solutions containing I-, a signal at the microelectrode was observed on type 304 stainless steel surfaces at active pitting corrosion sites. Under conditions where pitting corrosion occurs, SECM was used to track the temporal characteristics of the reaction in a spatial manner. However, because of the time required to create an image, much of the temporal information was not obtained. To improve the temporal resolution of the measurement, microelectrode array microscopy (MEAM) was developed as a parallel method of performing SECM. The demonstration shown reveals the potential of MEAM for analysis of surface chemistry on temporal and spatial domains.

Research Organization:
Idaho National Laboratory (INL)
Sponsoring Organization:
INEEL
DOE Contract Number:
AC07-99ID13727
OSTI ID:
912305
Report Number(s):
INEEL/JOU-04-02246
Journal Information:
Analytical Chemistry, Journal Name: Analytical Chemistry Journal Issue: 8 Vol. 77
Country of Publication:
United States
Language:
English