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Charge Retention by Peptide Ions Soft-Landed onto Self-Assembled Monolayer Surfaces

Journal Article · · International Journal of Mass Spectrometry, 265(1):237-243
Soft-landing of singly and doubly protonated peptide ions onto three self-assembled monolayer surfaces (SAMs) was performed using a novel ion deposition instrument constructed in our laboratory and a Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) specially designed for studying collisions of large ions with surfaces.. Modified surfaces were analyzed using in situ 2 keV Cs+ secondary ion mass spectrometry or ex situ 15 keV Ga+ time-of-flight secondary ion mass spectrometry (ToF-SIMS). The results demonstrate that a fraction of multiply protonated peptide ions retain more than one proton following soft-landing on the FSAM surface. [M+2H]2+ ions observed in FT-ICR SIMS spectra are produced by desorption of multiply charged ions from the surface, while re-ionization of singly protonated ions or neutral peptides is a source of [M+2H]2+ ions in Tof-SIMS spectra. Differences in neutralization efficiency of soft-landed ions following exposure of surfaces to laboratory air has a measurable effect on the results of ex situ ToF-SIMS analysis of soft-landed ions on SAM surfaces.
Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
910517
Report Number(s):
PNNL-SA-52953; 19594; 3584; 7996; KC0302020
Journal Information:
International Journal of Mass Spectrometry, 265(1):237-243, Journal Name: International Journal of Mass Spectrometry, 265(1):237-243 Journal Issue: 1 Vol. 265; ISSN 0168-1176; ISSN IJMPDN
Country of Publication:
United States
Language:
English

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