POLARIZATION STUDIES OF CdZnTe DETECTORS USING SYNCHROTRON X-RAY RADIATION.
Conference
·
OSTI ID:910362
New results on the effects of small-scale defects on the charge-carrier transport in single-crystal CdZnTe (CZT) material were produced. We conducted detailed studies of the role of Te inclusions in CZT by employing a highly collimated synchrotron x-ray radiation source available at Brookhaven's National Synchrotron Light Source (NSLS). We were able to induce polarization effects by irradiating specific areas with the detector. These measurements allowed the first quantitative comparison between areas that are free of Te inclusions and those with a relatively high concentration of inclusions. The results of these polaration studies will be reported.
- Research Organization:
- Brookhaven National Laboratory
- Sponsoring Organization:
- Doe - National Nuclear Security Administration
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 910362
- Report Number(s):
- BNL--77988-2007-CP; NN2001050
- Country of Publication:
- United States
- Language:
- English
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